Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Maroni V.A., Goyal A., Specht E.D., Paranthaman M., Aytug T., Christen D.K., Kim K., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L.
Ключевые слова: presentation, HTS, YBCO, coated conductors, MOD process, MOCVD process, comparison, microstructure, doping effect, fabrication, defects, nanoscaled effects, critical caracteristics, critical current density, angular dependence, phase composition, Raman spectroscopy, defects columnar, critical current
Ключевые слова: HTS, YBCO, REBCO, coated conductors, RABITS process, TFA-MOD process, fabrication, Raman spectroscopy, phase formation, thickness dependence, time evolution
Maroni V.A., Goyal A., Paranthaman M., Aytug T., Heatherly L., Kim K., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication
Ключевые слова: HTS, coated conductors, MOD process, YBCO, nucleation, fabrication, thickness dependence, critical caracteristics, RABITS process, plans, funding, presentation
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, long conductors, critical caracteristics, fabrication, doping effect, plans, funding, presentation
Miller D.J., Maroni V.A., Rupich M.W., Li X., Specht E.D., Christen D.K., Larbalestier D.C., Sathyamurthy S., Thompson J.R., Feenstra R., Xu A., Sinclair J.
Miller D.J., Maroni V.A., Li X., Rupich M., Chen Z., Sathyamurthy S., Feenstra R., Zaluzec N.J., Cooley K.
Ключевые слова: HTS, YBCO, coated conductors, funding, fabrication, microstructure, microstructure, measurement technique, nucleation, MOD process, plans, collaborations, presentation
Ключевые слова: presentation, HTS, coated conductors, measurement technique, Raman spectroscopy, homogeneity, REBCO, YBCO
Miller D.J., Maroni V.A., Li X., Zhang W., Kodenkandath T., Chen Z., Holesinger T.G., Larbalestier D.C., Feenstra R., Coulter J.Y., Civale L., Maiorov B., Feldmann D.M., Huang Y.
Ключевые слова: HTS, YBCO, coated conductors, nanoscaled effects, microstructure, chemical solution deposition, fabrication, nucleation, porosity, critical current, n-value, homogeneity, thickness dependence, pinning force, MOD process, critical current density, angular dependence, RABITS process, PLD process, Jc/B curves, critical caracteristics
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